M5, T-styli, silicon nitride sphere, stepped, tungsten carbide shaft
T-styli consist of two opposing measuring probe spheres mounted at 90° to the shaft. These styli are particularly suitable for measuring opposing holes and undercuts, such as grooves. In addition, T-styli can also be used for measuring points that are difficult to access (e.g. on the underside of the workpiece).
Tungsten carbide is the most common shaft material, it combines a very good stiffness with an acceptable thermal expansion. Only the weight can have a negative effect when using large styli. The design of the stepped shaft has the advantage of a greater shaft thickness, which is reduced towards the probe element. This graduation increases the stability of the stylus while maintaining the same length. However, the usable measuring length is reduced as a result. Tungsten carbide shafts represent a good combination in terms of weight, rigidity and thermal expansion.
Silicon nitride styli are just as universally applicable as ruby styli. However, they show less material deposits when scanning aluminum or other soft materials. This does not mean that there iare no deposits here. SiN spheres also shows this problem, the effect only occurs at a later point in time in the process. Due to the almost identical hardness compared to ruby, SiN spheres are equally susceptible to material removal when measuring hard, abrasive materials.
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